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Specimen Stubs & Mounts
SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45° chamfer

SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45° chamfer

SEM Specimen Stubs for HITACHI instruments. 15mm diameter.

All prices exclude VAT.

Description

Product Description

SEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45° chamfer. Aluminium.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.