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Specimen Stubs & Mounts
SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin

SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.

All prices exclude VAT.

Description

Product Description

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.