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SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon

SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon.

Special prices valid while stocks last. 

All prices exclude VAT.
Description
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AGG3427
In Stock

POA

Product Description
SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon
If the background radiation from an aluminium stub is undesirable, a stub made of spectroscopically pure carbon may be used.
Supplied individually.
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.