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SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon

SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.

Special prices valid while stocks last. 

All prices exclude VAT.
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AGG3423
In Stock

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Product Description
SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.
If the background radiation from an aluminium stub is undesirable, a stub made of spectroscopically pure carbon may be used.
Supplied individually.
Delivery & Returns

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Average lead time: 1 to 25 days

POA

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.