Agar Scientific specialises in producing a wide range of specimens specifically for SEM test and calibration where quantification or high resolution results are required.
SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images ideally should show fine detail together with a lack of noise, evidenced by a good range of grey levels.
For assessments of resolution in scanning electron microscopes, we have developed a range of gold on carbon and tin on carbon test specimens. These specimens are suitable for tests of SE and BSE imaging and also for chemical mapping in high resolution systems such as in Auger scanning instruments. The specimens can be supplied on most types of specimen stub.
Glass Size StandardsGlass microspheres can be used in any application that requires a NIST traceable size standard with a narrow size distribution, and where sample conditions may not be suitable for polystyrene spheres.Average lead time: 1 to 199 daysPOA
Average lead time: 1 to 199 days
Silicon Test SpecimenA silicon test specimen made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick. Special prices valid while stocks last.Average lead time: 1 to 27 daysPOA
Average lead time: 1 to 27 days
