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Tin on Carbon AGS1967 - Resolution Test Specimen

Resolution test specimen with a particle size range from approximately 10 - 100nm.

All prices exclude VAT.
Name & Code
Grouped product items
Code & DescriptionAvailabilityPriceQty
AGS1967
Tin on Carbon Test Specimen on Pin Stub 12.5 mm dia., 3.2 x 8 mm pin
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POA
POA
AGS1967A
Tin on Carbon Test Specimen on JEOL Stub 10 mm dia., 10 mm height
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POA
POA
AGS1967B
Tin on Carbon Test Specimen on ISI Stub 15 mm dia., 10 mm height
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POA
POA
AGS1967C
Tin on Carbon Test Specimen on Hitachi Stub 15 mm dia., 10 mm height
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POA
POA
AGS1967D
Tin on Carbon Test Specimen on Customer Specified Stub*
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POA
POA
AGS1967E
Tin on Carbon Test Specimen on JEOL stub 12.5 mm dia., 10 mm height
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POA
POA
AGS1967S
Tin on Carbon Test Specimen on Short Pin Stub 12.5 mm dia., 3.2 x 6 mm pin
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POA
POA
AGS1967T
Tin on Carbon Test Specimen Unmounted, Thin Carbon Disc
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POA
POA
AGS1967U
Tin on Carbon Test Specimen Unmounted
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POA
POA
Product Description

An alternative test specimen for medium resolution evaluation and for the day-to-day visual checking of instrument performance is a tin on carbon specimen. This consists of a dispersion of tin spheres,within the size range 10 - 100nm, on a carbon substrate. Ideal for astigmatism correction, it is also recommended for use in SEMs employed in the semiconductor industry, where the usual gold on carbon sample cannot be used because of the risk of gold poisoning.

*When requesting a quote for AGS1967D, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.