Tin on Carbon AGS1988 - Low Voltage Resolution Test Specimen

Low voltage resolution test specimen with a particle size range from approximately <20 - 400nm.

All prices exclude VAT.

Description Tech Data

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGS1988 Low KV Tin on Carbon Specimen on Pin Stub 12.5 mm dia., 3.2 x 8 mm pin Loading...	Loading...	POA	POA
AGS1988A Low KV Tin on Carbon Specimen on JEOL Stub 10 mm dia., 10 mm height Loading...	Loading...	POA	POA
AGS1988B Low KV Tin on Carbon Specimen on ISI Stub 15 mm dia., 10 mm height Loading...	Loading...	POA	POA
AGS1988C Low KV Tin on Carbon Specimen on Hitachi Stub 15 mm dia., 10 mm height Loading...	Loading...	POA	POA
AGS1988D Low KV Tin on Carbon Specimen on Customer Specified Stub* Loading...	Loading...	POA	POA
AGS1988E Low KV Tin on Carbon Specimen on JEOL stub 12.5 mm dia., 10 mm height Loading...	Loading...	POA	POA
AGS1988S Low KV Tin on Carbon Specimen on Short Pin Stub 12.5 mm dia., 3.2 x 6 mm pin Loading...	Loading...	POA	POA
AGS1988T Low KV Tin on Carbon Specimen Unmounted, Thin Loading...	Loading...	POA	POA
AGS1988U Low KV Tin on Carbon Specimen Unmounted Loading...	Loading...	POA	POA

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.

Type	Mount	Part Code
AGSXXXX	Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin	AGG301
AGSXXXXA	JEOL specimen stub, 10 mm diameter, 10 mm height	AGG306
AGSXXXXB	ISI specimen stub, 15 mm diameter, 10 mm height	AGG307
AGSXXXXC	Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread	AGG3313
AGSXXXXD	Customer specified stub from our catalogue, or provide information on the stub you will send for mounting	-
AGSXXXXE	JEOL specimen stub, 12.5 mm diameter, 10 mm height	AGG3384
AGSXXXXS	Short pin specimen stub, 12.5 mm diameter, 3.2 x 6 mm pin	AGG301F
AGSXXXXT	Unmounted, thin carbon disc	-
AGSXXXXU	Unmounted	-