SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images ideally should show fine detail together with a lack of noise, evidenced by a good range of grey levels.
For assessments of resolution in scanning electron microscopes, we have developed a range of gold on carbon and tin on carbon test specimens. These specimens are suitable for tests of SE and BSE imaging and also for chemical mapping in high resolution systems such as in Auger scanning instruments.
The specimens can be supplied on most types of specimen stub.
- Gold on Carbon AGS1969 - High Resolution Test SpecimenHigh resolution test specimen with a particle size range from approximately 3 - 50nm. Special prices valid while stocks last.Average lead time: 43 days
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Average lead time: 43 days 
Gold on Carbon AGS1987 - Ultra High Resolution Test SpecimenUltra high resolution test specimen with a particle size range from approximately <2 - 30nm.Average lead time: 1 to 43 daysPOA
Average lead time: 1 to 43 days
Tin on Carbon AGS1967 - Resolution Test SpecimenResolution test specimen with a particle size range from approximately 10 - 100nm.Average lead time: 1 to 43 daysPOA
Average lead time: 1 to 43 days- Medium resolution aluminium-tungsten dendrites AGS145The various spacings created by the dendritic structure of this specimen are suitable for performing point resolution tests and the topographical arrangement of the dendrites for a grey level test. Special prices valid while stocks last.In Stock
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In Stock - Gold on Carbon AGS168Z - Low Voltage Resolution Test SpecimenLow voltage resolution test specimen with a particle size range from approximately <30 - 300nm. Special prices valid while stocks last.Average lead time: 1 to 43 days
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Average lead time: 1 to 43 days 
Tin on Carbon AGS1988 - Low Voltage Resolution Test SpecimenLow voltage resolution test specimen with a particle size range from approximately <20 - 400nm.Average lead time: 26 daysPOA
Average lead time: 26 days
Tin on Carbon AGS1937 - Universal Resolution SpecimenUniversal resolution test specimen with a particle size range from approximately <5nm - 30um.Average lead time: 1 to 43 daysPOA
Average lead time: 1 to 43 days
Pelco Nanogold resolution test standards for SEM and FESEMUnique gold nanoparticles on silicon provide resolution standards with known and uniform particle size, ideally suited for high resolution tests for SEM, FESEM and FIB/SEM systems.Average lead time: 12 to 43 daysPOA
Average lead time: 12 to 43 days
Reference specimens for backscattered electron detection systemsAn electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen.Average lead time: 12 to 28 daysPOA
Average lead time: 12 to 28 days
Duplex reference specimen AGS1953An alternative and very sensitive test is by means of an alloy with two major copper/zinc phases separated by an atomic number difference of 0.1.Average lead time: 28 daysPOA
Average lead time: 28 days
Pelco Gold SpecimenThis specimen consists of gold platelets with a wide size range and sharp, clearly defined edges, making it useful for determining and correcting astigmatism, and verifying instrument resolution.Average lead time: 12 to 43 daysPOA
Average lead time: 12 to 43 days- Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um...This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.Average lead time: 1 to 12 days
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Average lead time: 1 to 12 days 
Critical dimension (CD) calibration test specimens - 500-200-100 nm...This advanced CD calibration test specimen is suitable for calibrating smaller structures.Average lead time: 12 daysPOA
Average lead time: 12 days
SEM 144nm Reference StandardThese 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.Average lead time: 12 to 43 daysPOA
Average lead time: 12 to 43 days
SEM 144nm Reference Standard, CertifiedThese 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.Average lead time: 12 to 43 daysPOA
Average lead time: 12 to 43 days
SEM 300nm Reference StandardThese 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.Average lead time: 12 to 43 daysPOA
Average lead time: 12 to 43 days
292nm Reference Standard292nm pitch reference standard for very high resolution calibration of AFM, SEM, Auger and FIB.Average lead time: 12 to 43 daysPOA
Average lead time: 12 to 43 days
2-D holographic array standards2-D holographic array standards for simultaneous calibration of X and Y axes.Average lead time: 12 to 28 daysPOA
Average lead time: 12 to 28 days
Gold on Carbon AGS168 - Resolution Test SpecimenResolution test specimen with a particle size range from approximately 5 - 150nm.Average lead time: 43 daysPOA
Average lead time: 43 days
