These particle size standards are certified for mean diameter and are traceable to National Institute of Standards and Technology (NIST) standards.
They are available as uniform spheres in a range of discrete sizes from 20nm to 2000μm. The spherical diameters are calibrated with linear dimensions transferred from NIST standard reference materials.
The products can be used for the calibration of electron microscopes, AFMs, light scattering instruments and other particle measuring equipment. Size standards are available in polystyrene, silica or glass.
- Certified Silicon Test SpecimensIndividual silicon test specimens are calibrated to a guaranteed accuracy of better than 1%.Average lead time: 26 days
POA
Average lead time: 26 days