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These particle size standards are certified for mean diameter and are traceable to National Institute of Standards and Technology (NIST) standards.

They are available as uniform spheres in a range of discrete sizes from 20nm to 2000μm. The spherical diameters are calibrated with linear dimensions transferred from NIST standard reference materials.

The products can be used for the calibration of electron microscopes, AFMs, light scattering instruments and other particle measuring equipment. Size standards are available in polystyrene, silica or glass.

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  1. Certified Silicon Test Specimens
    Individual silicon test specimens are calibrated to a guaranteed accuracy of better than 1%.
    Average lead time: 26 days

    POA

    Average lead time: 26 days
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
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