Individual silicon test specimens are calibrated to a guaranteed accuracy of better than 1% and are supplied with a laboratory certificate as documented proof. The equipment is checked against a reference specimen calibrated by the NPL by laser beam interferometry.
Also see our recalibration service.
The silicon specimen can be supplied on any stub.
* When requesting a quote for AGS1932D-CT, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.
*All unless otherwise specified.
Type | Mount | Part Code |
AGSXXXX | Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin | AGG301 |
AGSXXXXA | JEOL specimen stub, 10 mm diameter, 10 mm height | AGG306 |
AGSXXXXB | ISI specimen stub, 15 mm diameter, 10 mm height | AGG307 |
AGSXXXXC | Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread | AGG3313 |
AGSXXXXD | Customer specified stub from our catalogue, or provide information on the stub you will send for mounting | - |
AGSXXXXE | JEOL specimen stub, 12.5 mm diameter, 10 mm height | AGG3384 |
AGSXXXXS | Short pin specimen stub, 12.5 mm diameter, 3.2 x 6 mm pin | AGG301F |
AGSXXXXT | Unmounted, thin carbon disc | - |
AGSXXXXU | Unmounted | - |
LEAD TIMES: Average Lead Times are shown individually in days for any products not currently in stock. Whilst we are working closely with our suppliers to minimise the impact of global supply chain issues, and regularly update our product prices and lead times, some are subject to change due to supply chain fluctuations.
Delivery is calculated at the checkout, please see our delivery and returns page for more information.