Tin on Carbon AGS1988 - Low Voltage Resolution Test Specimen
Low voltage resolution test specimen with a particle size range from approximately <20 - 400nm.
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- Tin on Carbon AGS1988 - Low Voltage Resolution Test Specimen
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Similar to the AGS168Z specimen, this tin on carbon specimen with larger spheres is easier to use in low kV imaging mode and where gold on carbon may not be appropriate. The spherical nature of the balls makes them ideal for astigmatism assessment. Particle size range from approximately <20 - 400nm.
* When requesting a quote for AGS1988D, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.
SEM Specimen mounts selection guide
*All unless otherwise specified.
| Type | Mount | Part Code |
| AGSXXXX | Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin | AGG301 |
| AGSXXXXA | JEOL specimen stub, 10 mm diameter, 10 mm height | AGG306 |
| AGSXXXXB | ISI specimen stub, 15 mm diameter, 10 mm height | AGG307 |
| AGSXXXXC | Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread | AGG3313 |
| AGSXXXXD | Customer specified stub from our catalogue, or provide information on the stub you will send for mounting | - |
| AGSXXXXE | JEOL specimen stub, 12.5 mm diameter, 10 mm height | AGG3384 |
| AGSXXXXS | Short pin specimen stub, 12.5 mm diameter, 3.2 x 6 mm pin | AGG301F |
| AGSXXXXT | Unmounted, thin carbon disc | - |
| AGSXXXXU | Unmounted | - |
LEAD TIMES: Average Lead Times are shown individually in days for any products not currently in stock. Whilst we are working closely with our suppliers to minimise the impact of global supply chain issues, and regularly update our product prices and lead times, some are subject to change due to supply chain fluctuations.
Delivery is calculated at the checkout, please see our delivery and returns page for more information.
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.