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FIB
Probe tips and tip holders for AutoProbe instruments

Probe tips and tip holders for AutoProbe instruments

These tungsten probe tips for the AutoProbe 300 nanomanipulator have been designed to allow speedy in situ probe tip exchange and are compatible with the Short-Cut tool.

All prices exclude VAT.

Description

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGJ412 AP300 tungsten probe tips. Box of 20. Tip radius 0.5µm, 8-10° taper angle. Loading...	Loading...	POA	POA
AGJ413 AP250 probe tips. Box of 10. Tip radius 0.5µm, 10° taper angle. Loading...	Loading...	POA	POA
AGJ415 AP300 Helios 1200 probe tips. Box of 20. Tip radius 0.5µm, 10° taper angle. Loading...	Loading...	POA	POA

Product Description

These tungsten probe tips for the AutoProbe 300 nanomanipulator have been designed to allow speedy in situ probe tip exchange and are compatible with the Short-Cut tool. The AP250 probe tip is also compatible with the Short-Cut tool for direct conversion to TEM grids. In situ tungsten probe tips for an AutoProbe 300 fitted to an FEI Helios 1200 are also available.

The AP250 probe point holder has been designed to hold the AP250 tungsten probe tip (AGJ413). It is compatible with the Short-Cut tool for direct conversion to TEM grids. The holder is supplied with a storage vial.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.