SEM

SALE
SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167
SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.
Average lead time: 19 days
POA
Average lead time: 19 days

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SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170
SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.
In Stock
POA
In Stock

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SALE
SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166
SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.
In Stock
POA
In Stock

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