SEM

SALE
SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167
SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.
Average lead time: 20 days
POA
Average lead time: 20 days

Down

Up
SALE
SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon AGG3427
SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon. Special prices valid while stocks last.
In Stock
POA
In Stock

Down

Up
SALE
SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170
SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.
In Stock
POA
In Stock

Down

Up
SALE
SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166
SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.
In Stock
POA
In Stock

Down

Up
SEM Cylinder Specimen Mounts
Large Specimen and Metallurgical Mounts for JEOL microscopes.
Average lead time: 20 to 29 days
POA
Average lead time: 20 to 29 days
SALE
SEM Specimen Stubs, 10mm dia, 10mm high, carbon AGG323
SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high. Carbon. Special prices valid while stocks last.
In Stock
POA
In Stock

Down

Up