SEM

Bulk specimen holder holds irregular and round specimens up to a diameter of 32mm. Special prices valid while stocks last. 

Low-speed mixer for EM specimen infiltration preparations (0.5 - 7.5 RPM), design provides two angles 55° or 35°. Special prices valid while stocks last. 

Functionalised carbon support films: hydrophilic basic, hydrophilic positive, hydrophilic negative, hydrophobic. Special prices valid while stocks last. 

Highly conductive, copper based spray suitable for shielding against electromagnetic interference, as well as to protect against electrostatic discharge. Special prices valid while stocks last. 

Deben Coolstage SEM Specimen Stubs Special prices valid while stocks last. 

Environmental Microscopy specimen stubs. Special prices valid while stocks last. 

SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium. Special prices valid while stocks last. 

Indium wire for high vacuum seals in clean systems. Special prices valid while stocks last. 

3.00mm dia, 0.25mm thick. Molybdenum. High quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems. Special prices valid while stocks last. 

Thin foil apertures are frequently used in the objective lenses of high resolution and electron beam lithography instruments. Special prices valid while stocks last. 

2mm dia, 0.6mm thick. Molybdenum. High quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems. Special prices valid while stocks last.  

Cryo sample pins with 2mm diameter pins compatible with Leica & RMC Cryo-Ultramicrotomes.

This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.

All discs are 1mm thick, unless otherwise specified.

4mm dia, 0.6mm thick. Platinum/Iridium. High-quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.

Crystalbond adhesives allow temporary bonding of delicate crystals, metallurgical samples, glass components and ceramic substrates.

1.85mm dia, 0.1mm thick. Platinum/iridium. High quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.

Adaptor allowing 32mm Cambridge stubs with re-entrant bases to be used in a stage designed for pin type stubs.

A range of 3mm thick carbon discs for mounting specimens.

10mm dia, 0.6mm thick. Platinum/iridium. High-quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.

Replaceable apertures for the Wehnelt cylinder can be supplied to fit some microscopes. Special prices valid while stocks last. 

2mm dia, 0.1mm thick. Platinum/iridium. High quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems. Special prices valid while stocks last. 

High resolution test specimen with a particle size range from approximately 3 - 50nm. Special prices valid while stocks last.