Scanning electron microscope resolution can be tested using resolved gaps and the number of grey levels in the image of a test specimen. Testing ensures the highest image quality by checking the resolution hasn’t been distorted by using the contrast to maximise visibility of edges. 

Agar Scientific manufacturers an extensive range of high quality resolution and grey level test specimens for your scanning electron microscopy assessments. These include gold on carbon and tin on carbon test specimens and are suitable for tests of SE imaging, BSE imaging and chemical mapping. Plus, the specimens can be supplied on most types of specimen stub. 

Which test specimen is right for your application?  

Read on to find out… 

Gold on Carbon AGS1969 - High Resolution Test Specimen

  • Type: Gold on carbon 
  • Resolution: High 
  • Magnification required: x80,000 minimum 
  • Particle size range: <3 - 50nm 
  • Ideal for: Assessing the image quality of high resolution SEMs, such as those fitted with a field emission electron source 

Gold on Carbon AGS1987 - Ultra High Resolution Test Specimen

  • Type: Gold on carbon 
  • Resolution: Ultra High 
  • Magnification required: x80,000 minimum 
  • Particle size range: <2 – 30 nm 
  • Ideal for: For ultra high resolution performance testing, this specimen has a smaller gold island particle size compared to the AGS168 specimens 

Tin on Carbon AGS1967 - Resolution Test Specimen

  • Type: Tin on carbon 
  • Resolution: Medium 
  • Magnification required: Unspecified 
  • Particle size range: 10 – 100 nm 
  • Ideal for: For the day-to-day visual checking of instrument performance. Ideal for astigmatism correction, it is also recommended for use in SEMs employed in the semiconductor industry, where the usual gold on carbon sample cannot be used because of the risk of gold poisoning. 

Gold on Carbon AGS168Z - Low Voltage Resolution Test Specimen  

  • Type: Gold on carbon 
  • Resolution: Low Voltage 
  • Magnification required: Unspecified 
  • Particle size range: <30 – 300 nm 
  • Ideal for: Operating at low accelerating voltages or for use with older instruments. The larger gold islands give high contrast while retaining small gaps for resolution measurement, making this specimen easier to use at non-optimal operating conditions. 

Tin on Carbon AGS1988 - Low Voltage Resolution Test Specimen  

  • Type: Tin on carbon 
  • Resolution: Low Voltage 
  • Magnification required: Unspecified 
  • Particle size range: <20 – 400 nm 
  • Ideal for: Similar to AGS168Z but with larger spheres, making it easier to use in low kV imaging mode and where gold on carbon may not be appropriate. Ideal for astigmatism assessment. 

Tin on Carbon AGS1937 - Universal Resolution Specimen  

Universal resolution test specimen with a particle size range from approximately. 

  • Type: Tin on carbon 
  • Resolution: Universal 
  • Magnification required: Unspecified 
  • Particle size range: <5 nm – 30 µm 
  • Ideal for: Various applications due to the wide size range of tin spheres, which give high contrast when imaged in the SEM. The largest spheres can be used for basic column alignment at low magnification; intermediate sized spheres are useful for monitoring image shift when changing operating parameters or resolution checking at low kV; and the smallest spheres can be used for resolution checking and astigmatism correction at the very highest magnifications. 

For more information, please visit the product pages or contact our technical team at [email protected].