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AFM & SPM
Probes - OPUS Series
Four AFM cantilevers, without coating 17/75/150/1200kHz, 0.3/2.5/9/100N/m

Four AFM cantilevers, without coating 17/75/150/1200kHz, 0.3/2.5/9/100N/m

Four AFM cantilevers without coating for various applications. Topography measurement.

All prices exclude VAT.

Description Tech Data

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGF723-10 Multiple AFM cantilevers, no coating 17/75/150/1200kHz, 0.3/2.5/9/100N/m Pk10 Loading...	Loading...	POA	POA
AGF723-24 Multiple AFM cantilevers, no coating 17/75/150/1200kHz, 0.3/2.5/9/100N/m Pk24 Loading...	Loading...	POA	POA
AGF723-50 Multiple AFM cantilevers, no coating 17/75/150/1200kHz, 0.3/2.5/9/100N/m Pk50 Loading...	Loading...	POA	POA
AGF723-100 Multiple AFM cantilevers, no coating 17/75/150/1200kHz, 0.3/2.5/9/100N/m Pk100 Loading...	Loading...	POA	POA

Product Description

The 4XC-NN series features four different cantilevers for various measurement modes, two on each side of the holder chip:

A - Contact mode imaging
B - Tapping mode imaging on soft samples
C - Standard tapping mode imaging
D - High speed scanning

The uncoated version offers sharp tip apexes, chemical inertness and high cantilever Quality factors. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.

Tip Side coating: none
Back Side coating: none

Technical Data

Cantilever	Res. Frequency (kHz)	Force Constant (N/m)	Tip Radius (nm)	Length (±10µm)	Width (±2µm)	Thickness (±0.5µm)
A	17 (11 - 22)	0.3 (0.1 - 0.6)	<30	500	30	3
B	75 (50 - 100)	2.5 (0.75 - 5.3)	<30	240	30	3
C	150 (100-200)	9 (2.8-21)	<30	175	40	3
D	1200 (650 - 1850)	100 (35 - 215)	<30	65	31	3

Delivery & Returns

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.