Three AFM cantilevers, Al reflective coating, 17/150/75kHz, 0.3/9/2.5N/m
Three AFM cantilevers with Al reflective for various applications. Topography measurement.
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Product Description
Delivery & Returns
The 3XC NA series features three different cantilevers for various measurement modes:
- A - Contact mode imaging
- B - Soft AC mode cantilever for imaging soft samples
- C - Standard AC mode cantilever
The uncoated tips offer sharp tip apexes and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tips are located precisely at the free ends of the cantilevers. This allows the tips to be positioned accurately over the area of interest on the sample surface.
Coating:
Tip Side: none
Back Side: Al, 30nm
Specification
| Cantilever | Res. Frequency (kHz) | Force Constant (N/m) | Tip Radius (nm) | Length (±10µm) | Width (±2µm) | Thickness (±5µm) |
| A | 17 (11 - 22) | 0.3 (0.1 - 0.6) | <7 | 500 | 30 | 3 |
| B | 150 (100-200) | 9 (2.8-21) | <7 | 175 | 40 | 3 |
| C | 75 (50 - 100) | 2.5 (0.75 - 5.3) | <7 | 240 | 30 | 3 |