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Probes - OPUS Series
High freqencey cantilever, Al reflective coating 1200kHz 100N/m

High freqencey cantilever, Al reflective coating 1200kHz 100N/m

High frequency tapping mode cantilever with Al reflective coating. Topography measurement.

All prices exclude VAT.

Description Features & specs

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGF724-5 High freq. cantilever, Al reflective coating 1200kHz 100N/m Pk5 Loading...	Loading...	POA	POA
AGF724-10 High freq. cantilever, Al reflective coating 1200kHz 100N/m Pk10 Loading...	Loading...	POA	POA
AGF724-24 High freq. cantilever, Al reflective coating 1200kHz 100N/m Pk24 Loading...	Loading...	POA	POA
AGF724-50 High freq. cantilever, Al reflective coating 1200kHz 100N/m Pk50 Loading...	Loading...	POA	POA
AGF724-100 High freq. cantilever, Al reflective coating 1200kHz 100N/m Pk100 Loading...	Loading...	POA	POA

Product Description

The 55AC-NA series is designed for high speed AC mode imaging. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminium coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the are of interest on the sample surface.

Tip Side coating: none
Back Side coating: Al, 30nm

Features & Specifications

Cantilever

Single

Resonant Frequency (kHz)

1200 (650 - 1850)

Force Constant (N/m)

100 (35 - 215)

Tip Radius (nm)

< 7

Length (±10µm)

Width (±2µm)

Thickness (±0.5µm)

Tip Side Coating

None

Back Side Coating

Al, 30nm

Delivery & Returns

More AFM & SPM

Calibration Standards Diamond Knives Probes - HQ Series Probes - OPUS Series Probes - General Imaging (SCOUT Range)Probes - Conductive (SPARK Range)Specimen Preparation Specimen Storage Substrates

PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.