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Probes - OPUS Series
AFM cantilever, no coating 300kHz 26N/m

AFM cantilever, no coating 300kHz 26N/m

Standard tapping mode AFM cantilever without coating. Topography measurement.

All prices exclude VAT.

Description Features & specs

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGF709-10 AFM cantilever, no coating 300kHz 26N/m Pk10 Loading...	Loading...	POA	POA
AGF709-24 AFM cantilever, no coating 300kHz 26N/m Pk24 Loading...	Loading...	POA	POA
AGF709-50 AFM cantilever, no coating 300kHz 26N/m Pk50 Loading...	Loading...	POA	POA
AGF709-100 AFM cantilever, no coating 300kHz 26N/m Pk100 Loading...	Loading...	POA	POA

Product Description

The 160AC NN series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Tip Side coating: none
Back Side coating: none

Features & Specifications

Cantilever

Single

Resonant Frequency (kHz)

300 (200 - 400)

Force Constant (N/m)

26 (8 - 57)

Tip Radius (nm)

< 7

Length (±10µm)

160

Width (±2µm)

Thickness (±0.5µm)

Tip Side Coating

None

Back Side Coating

None

Delivery & Returns

More AFM & SPM

Calibration Standards Diamond Knives Probes - HQ Series Probes - OPUS Series Probes - General Imaging (SCOUT Range)Probes - Conductive (SPARK Range)Specimen Preparation Specimen Storage Substrates

PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.