AFM cantilever, Al reflective coating 70kHz 2N/m
Soft tapping mode AFM cantilever with Al reflective coating. Topography measurement.
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Product Description
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The 240ACNA series is designed for AC mode AFM imaging of soft samples. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminium coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
Coating:
Tip Side: none
Back Side: Al, 30nm
Specification
| Cantilever | Res. Frequency (kHz) | Force Constant (N/m) | Tip Radius (nm) | Length (±10µm) | Width (±2µm) | Thickness (±0.5µm) |
| Single | 70 (45 - 90) | 2 (0.6 - 3.9) | <7 | 240 | 40 | 2.6 |