AFM cantilever, Al reflective coating 135kHz 9N/m
Standard tapping mode AFM cantilever with Al reflective coating. Topography measurement.
Standard tapping mode AFM cantilever with Al reflective coating. Topography measurement.
The 200AC NA series is designed for AC mode AFM imaging of standard and soft samples. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
Tip Side coating: none
Back Side coating: Al, 30nm