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Probes - OPUS Series
AFM cantilever, Al reflective coating 135kHz 9N/m

AFM cantilever, Al reflective coating 135kHz 9N/m

Standard tapping mode AFM cantilever with Al reflective coating. Topography measurement.

All prices exclude VAT.

Description Features & specs

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGF711-10 AFM cantilever, Al reflective coating 135kHz 9N/m Pk10 Loading...	Loading...	POA	POA
AGF711-24 AFM cantilever, Al reflective coating 135kHz 9N/m Pk24 Loading...	Loading...	POA	POA
AGF711-50 AFM cantilever, Al reflective coating 135kHz 9N/m Pk50 Loading...	Loading...	POA	POA
AGF711-100 AFM cantilever, Al reflective coating 135kHz 9N/m Pk100 Loading...	Loading...	POA	POA

Product Description

The 200AC NA series is designed for AC mode AFM imaging of standard and soft samples. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Tip Side coating: none
Back Side coating: Al, 30nm

Features & Specifications

Cantilever

Single

Resonant Frequency (kHz)

135 (85 - 175)

Force Constant (N/m)

9 (3 - 22)

Tip Radius (nm)

< 7

Length (±10µm)

200

Width (±2µm)

Thickness (±0.5µm)

3.5

Tip Side Coating

None

Back Side Coating

Al, 30nm

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.