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AFM & SPM
Probes - HQ Series
High Resolution silicon probes

High Resolution silicon probes

High Resolution silicon probes.

All prices exclude VAT.

Description Tech Data

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGF1690-5 High Resolution silicon probe Cr Au coated 125x25x2.1 um - Pack of 5 Loading...	Loading...	POA	POA
AGF1700-5 High Resolution silicon probe Cr Au coated 125x30x4.0 um - Pack of 5 Loading...	Loading...	POA	POA
AGF1710-5 High Resolution silicon probe Cr Au coated 225x37.5x7.0um - Pack of 5 Loading...	Loading...	POA	POA

Product Description

The High Resolution probes suffer less contamination than silicon probes and are capable of obtaining many high-resolution scans, although they do require special care in use. Due to the small tip curvature radius, the tip-sample attraction force is minimized.

Advantages of High Resolution probes are noticeable when scanning small areas (<250nm) and flat samples (Ra <20nm). On larger images, the resolution is similar to that of General Purpose probes.

Key Features

Spike radius - <1nm
Spike height - 100-200nm
Spike material - diamond-like
Au overall coating - 30nm
Cr overall sublayer - 20nm

Technical Data

Part Code	AGF1690	AGF1700	AGF1710
Available coatings	Cr-Au	Cr-Au	Cr-Au
Length ±5µm	125	125	125
Width ±3µm	25	30	22.5
Thickness ±0.5µm	2.1	4.0	1.0
Resonance frequency kHz (typical)	160	325	65
Resonance frequency kHz (range)	110-220	265-410	25-120
Force constant n/m (typical)	5.0	40.0	0.5
Force constant n/m (range)	1.8-13	20-80	0.05-2.3

High Resolution Silicon Probes are packaged in special vacuum-sealed ESD shielding bags. While the probes remain in the closed ESD protective bag, there is no risk of ESD damage.

Before opening the ESD bag in an ESD-protected area please ensure that you are grounded (e.g. with a static dissipative wrist strap or ESD-protective footwear) and the gel box is on ground potential (e.g. by using a grounded pad).

Gel box

Before opening the gel box please ensure that the delivered probes are consistent with your order and there is no sign of transportation damage (e.g. loose AFM probes).

Delivery & Returns

More AFM & SPM

Calibration Standards Diamond Knives Probes - HQ Series Probes - OPUS Series Probes - General Imaging (SCOUT Range)Probes - Conductive (SPARK Range)Specimen Preparation Specimen Storage Substrates

PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.