Silicon AFM probes - SPARK range from NuNano

High quality conductive AFM probes with a platinum coating for nanoscale electrical characterisation. These are manufactured to the tightest dimensional tolerances in the market, offering minimal variation in spring constant and resonant frequency.

Applications of these probes - Electrical AFM measurements including conductive atomic force microscopy (CAFM), piezo-response microscopy (PFM), electrostatic force microscopy (EFM), scanning kelvin probe microscopy (SKPM), scanning impedance microscopy (SIM) etc.

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SPARK 70 Pt - AC mode silicon AFM probes with Pt conductive coating... AGT705
Conductive AFM probes with platinum coating. Suitable for electrical characterisation in AC modes (non-contact, tapping).
Average lead time: 3 days
POA
Average lead time: 3 days

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SPARK 350 Pt - AC mode silicon AFM probes with Pt conductive coating... AGT704
Conductive AFM probes with platinum coating. Suitable for electrical characterisation in AC modes (non-contact, tapping).
Average lead time: 3 days
POA
Average lead time: 3 days

Down

Up