Supplies and consumables for AFM & SPM

JavaScript seems to be disabled in your browser. For the best experience on our site, be sure to turn on Javascript in your browser.

Menu

Language

€
$

ORDER ONLINE - quick & easy

AGENTS & DISTRIBUTORS - available worldwide

REQUEST QUOTES - fast online pricing

Home
AFM & SPM

Calibration Standards

Calibration Standards

Diamond Knives

Diamond Knives

Probes - HQ Series

Probes - HQ Series

Probes - OPUS Series

Probes - OPUS Series

Probes - General Imaging (SCOUT Range)

Probes - General Imaging (SCOUT Range)

Probes - Conductive (SPARK Range)

Probes - Conductive (SPARK Range)

Specimen Preparation

Specimen Preparation

Specimen Storage

Specimen Storage

Substrates

Substrates

PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.