Film Thickness Monitor
A compact, low cost, microprocessor-based film thickness monitor for use with the Agar range of coating units.
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This is a compact, low cost, microprocessor-based film thickness monitor for use with the Agar range of coating units. Originally designed for electron microscopy applications, it is also suitable for use in complex deposition systems. A dual memory stores parameters for two deposition materials. The system uses a 6MHz quartz crystal oscillator mounted in a crystal holder. The control unit has a digital readout, which displays coating thickness directly in nanometres, with a resolution of 0.1nm. A tooling factor can also be entered to compensate for differences in specimen and crystal position. The film thickness monitor features a measurement range of 0 to 999.9nm, and a display of crystal life.
The upgrade kits allow a single control unit to be shared between two Agar coaters.
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