Gold on Carbon AGS1969 - High Resolution Test Specimen
High resolution test specimen with a particle size range from approximately 3 - 50nm.
Special prices valid while stocks last.
High resolution test specimen with a particle size range from approximately 3 - 50nm.
Special prices valid while stocks last.
This specimen is particularly suitable for assessing the image quality of high resolution SEMs, such as those fitted with a field emission electron source. A magnification of at least x80,000 is required to clearly resolve the gold particles. Particle sizes range from <3 - 50nm.
* When requesting a quote for AGS1969D, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.
*All unless otherwise specified.
Type | Mount | Part Code |
AGSXXXX | Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin | AGG301 |
AGSXXXXA | JEOL specimen stub, 10 mm diameter, 10 mm height | AGG306 |
AGSXXXXB | ISI specimen stub, 15 mm diameter, 10 mm height | AGG307 |
AGSXXXXC | Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread | AGG3313 |
AGSXXXXD | Customer specified stub from our catalogue, or provide information on the stub you will send for mounting | - |
AGSXXXXE | JEOL specimen stub, 12.5 mm diameter, 10 mm height | AGG3384 |
AGSXXXXS | Short pin specimen stub, 12.5 mm diameter, 3.2 x 6 mm pin | AGG301F |
AGSXXXXT | Unmounted, thin carbon disc | - |
AGSXXXXU | Unmounted | - |
LEAD TIMES: Average Lead Times are shown individually in days for any products not currently in stock. Whilst we are working closely with our suppliers to minimise the impact of global supply chain issues, and regularly update our product prices and lead times, some are subject to change due to supply chain fluctuations.
Delivery is calculated at the checkout, please see our delivery and returns page for more information.