SEM Specimen Stubs, 12.5mm dia, carbon
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon
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Product DescriptionDelivery & Returns
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon
If the background radiation from an aluminium stub is undesirable, a stub made of spectroscopically pure carbon may be used.
Supplied individually.
If the background radiation from an aluminium stub is undesirable, a stub made of spectroscopically pure carbon may be used.
Supplied individually.
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