Agar Scientific is pleased to introduce several new products to its Critical Dimension Standard selection: ISO-Certified Critical Dimension Standards, as well as pre-mounted options for new and existing products in the range. Take a look at the range here.

Our Critical Dimensions Standards are economically priced, yet fully featured for calibration over a wide measurement range. A combination of 60 nm chrome for larger features and 20 nm chrome with 50 nm gold for high-resolution features provide increased contrast. Each die has a unique serial identification number and there are three options to choose from:

  • Traceable: Each CD Standard uses average data measured for each production wafer.
  • Certified: Each CD Standard is individually calibrated against a NIST measured standard.
  • ISO Certified: Each CD Standard is individually calibrated against an ISO measured standard.
Which mount is right for my application?

In addition to new ISO Certified CD Standards, we have also added new mounted options to the entire product line. Pre-mounted specimens not only save you time, but also improve the consistency of your SEM workflows.

To streamline your ordering process, our technical team has put together the following guide on our new range of specimen mounts:

Type

Mount

Part Code

AGSXXXX

Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin

AGG301

AGSXXXXA

JEOL specimen stub, 10 mm diameter, 10 mm height

AGG306

AGSXXXXB

ISI specimen stub, 15 mm diameter, 10 mm height

AGG307

AGSXXXXC

Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread

AGG3313

AGSXXXXD

Customer specified stub from our catalogue, or provide information on the stub you will send for mounting

-

AGSXXXXE

JEOL specimen stub, 12.5 mm diameter, 10 mm height

AGG3384

AGSXXXXT

Unmounted, thin carbon disc

-

AGSXXXXU

Unmounted

-

For more information please contact your Regional Account Manager or get in touch at [email protected].