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SEM pin stubs, high purity Aluminium, pack of 100

SEM pin stubs, high purity Aluminium, pack of 100

High purity 12.5mm dia aluminium SEM pin stubs.

All prices exclude VAT.

Description

Product Description

Standard stubs are manufactured from an aluminium alloy which contains approximately 5% copper. For analytical applications, these stubs are made from an alloy with lower levels of impurities. Suitable for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm, pin diameter 3.2mm.

Pack of 100.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.