- SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.In Stock£6.71In Stock
- SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-612.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.Average lead time: 42 days£3.99Average lead time: 42 days
- SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.In Stock£5.00In Stock
- SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.In Stock£4.99In Stock
- SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301ESEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£25.30In Stock
- SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£27.96In Stock
- SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.In Stock£153.83In Stock
- SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.In Stock£12.67In Stock
- SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In Stock£11.82In Stock
- SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In Stock£13.43In Stock
- SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.Average lead time: 42 days£57.30Average lead time: 42 days
- SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.Average lead time: 18 days£35.65Average lead time: 18 days
- SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.In Stock£8.06In Stock
- SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.In Stock£11.16In Stock
- SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.In Stock£11.95In Stock
- SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.In Stock£7.96In Stock
- SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.In Stock£7.80In Stock
- SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Average lead time: 42 days£12.48Average lead time: 42 days
- SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Average lead time: 42 days£14.14Average lead time: 42 days