- Reference specimens for backscattered electron detection systemsAn electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen.Average lead time: 12 to 28 days
From £396.96
Average lead time: 12 to 28 days - Duplex reference specimen AGS1953An alternative and very sensitive test is by means of an alloy with two major copper/zinc phases separated by an atomic number difference of 0.1.In Stock£405.80In Stock