- SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.Average lead time: 1 to 44 days
From £10.69
Average lead time: 1 to 44 days - SEM Specimen Stubs - Short PinSEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.Average lead time: 1 to 13 days
From £27.12
Average lead time: 1 to 13 days - SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.In Stock£29.35In Stock
- SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin AGG3325SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium. Special prices valid while stocks last.Average lead time: 44 daysSpecial Price £49.46 was £67.51 You save: £21.66 (27%)Average lead time: 44 days
- SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.In Stock£6.71In Stock
- SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-612.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.Average lead time: 44 days£3.99Average lead time: 44 days
- SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.In Stock£5.00In Stock
- SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.In Stock£4.99In Stock
- SEM Specimen Stubs, 32mm dia, 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.Average lead time: 1 to 29 days
From £92.96
Average lead time: 1 to 29 days - SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301ESEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£25.30In Stock
- SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.Average lead time: 44 days£27.96Average lead time: 44 days
- SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.In Stock£153.83In Stock
- SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin AGG399FSEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium. Pack of 50.Average lead time: 59 days£74.05Average lead time: 59 days
- SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.Average lead time: 1 day
From £29.02
Average lead time: 1 day - SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.In Stock£12.67In Stock
- SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage AGG306ASEM Specimen Stubs for JEOL instruments. 10mm diameter.In Stock£14.51In Stock
- SEM Specimen Stubs, 10mm dia, 10mm highSEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.Average lead time: 1 day
From £17.25
Average lead time: 1 day - SEM Specimen Stubs, 32mm dia, 10mm high AGG318SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.In Stock£98.93In Stock
- SEM Specimen Stubs, 32mm dia, re-entrant base AGG305SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.In Stock£108.22In Stock
- SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In Stock£11.82In Stock
- SEM Specimen Stubs, 12.7mm dia, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications. Special prices valid while stocks last.Average lead time: 1 day
From £20.33
Average lead time: 1 day - SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In Stock£13.43In Stock
- SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.Average lead time: 44 days£57.30Average lead time: 44 days
- SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.Average lead time: 20 days£35.65Average lead time: 20 days