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Instrumentation Tweezers & Tools SEM TEM LM AFM & SPM FIB General Consumables Cryo-EM Calibre Scientific Special Offers New Products

SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.
Average lead time: 1 to 27 days
From £10.69
Average lead time: 1 to 27 days
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301A
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
In Stock
£29.35
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SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.
In Stock
£6.71
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SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-6
12.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.
Average lead time: 44 days
£3.99
Average lead time: 44 days

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SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
Average lead time: 29 days
£5.00
Average lead time: 29 days

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SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
In Stock
£4.99
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SALE
SEM Specimen Stubs, 32mm dia, 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
Average lead time: 1 to 29 days
From £92.96
Average lead time: 1 to 29 days
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301E
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
In Stock
£25.30
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SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
In Stock
£27.96
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SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020A
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.
In Stock
£153.83
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SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
Average lead time: 1 day
From £29.02
Average lead time: 1 day
SEM Specimen Stubs, 32mm dia, 10mm high AGG318
SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.
Average lead time: 44 days
£98.93
Average lead time: 44 days

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SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
Average lead time: 34 days
£11.82
Average lead time: 34 days

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SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
In Stock
£13.43
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SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.
Average lead time: 44 days
£7.80
Average lead time: 44 days

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SEM Specimen Stubs, 12.5mm dia, carbon AGG321
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon
In Stock
£5.54
In Stock

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