Menu
  • +44 (0)114 224 2257
MENU SEARCH
BASKET ACCOUNT
Menu
Account
Settings
Language
Default Store View
£GBP
ORDER ONLINE - no minimum order value
AGENTS & DISTRIBUTORS - available worldwide
REQUEST QUOTES - fast online pricing
InstrumentationTweezers & ToolsSEMTEMLMAFM & SPMFIBGeneral ConsumablesCryo-EMCalibre ScientificSpecial OffersNew Products
Filtered (3)
QUICK BUY
Page

45 products available

You've viewed 24 of 45 products

Clear All
  1. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.
    Average lead time: 1 to 26 days

    From £10.69

    Average lead time: 1 to 26 days
  2. closed position with pushrod in place
    Small Springloaded Vice Clamp AG15341-4
    Small Springloaded vice clamp for samples up to 12.7mm (1/2").
    Average lead time: 19 days
    £259.83
    Average lead time: 19 days
    Down
    Up
  4. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301A
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
    In Stock
    £29.35
    In Stock
    Down
    Up
  6. Hitachi Metallographic Mount Holder 32mm, M4
    Hitachi Metallographic Mount Holder 32mm, M4 AGY5176
    Specimen holder for 1-1/4" or 30mm metallographic mounts. Made of aluminum with stainless steel allen screw. Allen wrench included.
    Average lead time: 28 days
    £104.47
    Average lead time: 28 days
    Down
    Up
  8. SALE FEI Microtome 8mm diameter stub
    FEI Microtome 8mm SEM Stub
    A small diameter stub designed for FEI instruments but can also be used with other microscopes. Special prices valid while stocks last. 
    Average lead time: 1 to 43 days

    From £14.10

    Average lead time: 1 to 43 days
  9. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.
    In Stock
    £6.71
    In Stock
    Down
    Up
  12. SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin
    SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-6
    12.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.
    Average lead time: 43 days
    £3.99
    Average lead time: 43 days
    Down
    Up
  13. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
    Average lead time: 28 days
    £5.00
    Average lead time: 28 days
    Down
    Up
  15. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
    In Stock
    £4.99
    In Stock
    Down
    Up
  17. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 32mm dia, 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
    Average lead time: 1 to 28 days

    From £92.96

    Average lead time: 1 to 28 days
  19. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301E
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
    In Stock
    £25.30
    In Stock
    Down
    Up
  20. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
    In Stock
    £27.96
    In Stock
    Down
    Up
  23. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020A
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.
    In Stock
    £153.83
    In Stock
    Down
    Up
  24. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
    Average lead time: 1 day

    From £29.02

    Average lead time: 1 day
  26. SEM Specimen Stubs
    SEM Specimen Stubs, 32mm dia, 10mm high AGG318
    SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.
    Average lead time: 43 days
    £98.93
    Average lead time: 43 days
    Down
    Up
  28. SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5 mm pin
    SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
    Average lead time: 33 days
    £11.82
    Average lead time: 33 days
    Down
    Up
  30. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
    In Stock
    £13.43
    In Stock
    Down
    Up
  31. SEM Specimen Stubs
    SEM Specimen Stubs, 15mm dia, 12mm high, M4 thread, angled 70°... AGG3313B
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD. Aluminium.
    In Stock
    £8.94
    In Stock
    Down
    Up
  34. SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer
    SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90°... AGG3313D
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer. Aluminium.
    Average lead time: 43 days
    £11.87
    Average lead time: 43 days
    Down
    Up
  35. SEM Specimen Stubs 15mm dia M4 thread
    SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45°... AGG3313A
    SEM Specimen Stubs for HITACHI instruments. 15mm diameter.
    In Stock
    £8.87
    In Stock
    Down
    Up
  37. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, threaded pin AGG3025
    SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.
    In Stock
    £252.35
    In Stock
    Down
    Up
  39. SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread
    SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread AGG3318
    SEM Specimen Stubs for HITACHI instruments. 32mm dia, 10mm high, M4 thread. Aluminium.
    Average lead time: 43 days
    £117.37
    Average lead time: 43 days
    Down
    Up
  41. SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread
    SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread AGG3313
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium. Pack of 50.
    In Stock
    £70.51
    In Stock
    Down
    Up
  42. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.
    Average lead time: 43 days
    £7.80
    Average lead time: 43 days
    Down
    Up
Filtered (3)
QUICK BUY
Page

45 products available

You've viewed 24 of 45 products

LOAD MORE PRODUCTS
Clear All
QUICK BUY
Load a list of SKUs
PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
FILTERS
Clear All
VIEW 45 PRODUCTS Cancel