- SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.Average lead time: 1 to 26 days
From £10.69
Average lead time: 1 to 26 days - SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.In Stock£29.35In Stock
- FEI Microtome 8mm SEM StubA small diameter stub designed for FEI instruments but can also be used with other microscopes. Special prices valid while stocks last.Average lead time: 1 to 43 days
From £14.10
Average lead time: 1 to 43 days - SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.In Stock£6.71In Stock
- SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-612.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.Average lead time: 43 days£3.99Average lead time: 43 days
- SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.Average lead time: 28 days£5.00Average lead time: 28 days
- SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.In Stock£4.99In Stock
- SEM Specimen Stubs, 32mm dia, 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.Average lead time: 1 to 28 days
From £92.96
Average lead time: 1 to 28 days - SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301ESEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£25.30In Stock
- SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£27.96In Stock
- SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.In Stock£153.83In Stock
- SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.Average lead time: 1 day
From £29.02
Average lead time: 1 day - SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.In Stock£12.67In Stock
- SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage AGG306ASEM Specimen Stubs for JEOL instruments. 10mm diameter.In Stock£14.51In Stock
- SEM Specimen Stubs, 10mm dia, 10mm highSEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.Average lead time: 1 day
From £17.25
Average lead time: 1 day - SEM Specimen Stubs, 32mm dia, 10mm high AGG318SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.Average lead time: 43 days£98.93Average lead time: 43 days
- SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.Average lead time: 33 days£11.82Average lead time: 33 days
- SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In Stock£13.43In Stock
- SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.Average lead time: 43 days£57.30Average lead time: 43 days
- SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.Average lead time: 19 days£35.65Average lead time: 19 days
- SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.In Stock£8.06In Stock
- SEM Specimen Stubs, 10mm dia, 10mm high, carbon AGG323SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high. Carbon. Special prices valid while stocks last.In StockSpecial Price £1.12 was £1.69 You save: £0.68 (34%)In Stock
- SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stubSEM Specimen Stubs for JEOL instruments. 25mm dia, 5mm high, cylinder stubs. Aluminium.Average lead time: 1 day
From £85.79
Average lead time: 1 day - SEM Specimen Stubs, 15mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.Average lead time: 53 days
From £35.86
Average lead time: 53 days