- SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.Average lead time: 1 day
From £10.69
Average lead time: 1 day - SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.In Stock£29.35In Stock
- SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301ESEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£25.30In Stock
- SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£27.96In Stock
- SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.In Stock£153.83In Stock
- SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.In Stock£14.66In Stock
- SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.In Stock£15.63In Stock
- SEM Specimen Stubs, 12.5mm dia, carbon AGG321SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. CarbonIn Stock£5.54In Stock
- SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon AGG3427SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon. Special prices valid while stocks last.In StockSpecial Price £2.83 was £4.41 You save: £1.90 (36%)In Stock