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SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
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£11.82
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SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
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£13.43
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SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172
SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.
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£11.16
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SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171
SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.
In Stock
£11.95
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SALE
SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170
SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.
In Stock
£7.96
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SEM Pin Stub 25.4mm diameter, Pk10 AG16144
SEM Pin Stub 25.4mm diameter with 9.5mm pin height.
In Stock
£34.98
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SEM pin mounts with engraved & numbered divisions
SEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs.
Average lead time: 18 to 27 days
From £8.61
Average lead time: 18 to 27 days