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  1. SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309
    SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.
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    £12.67
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  2. SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166
    SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.
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    £8.06
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  3. SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424
    SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.
    Average lead time: 44 days
    £12.48
    Average lead time: 44 days
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
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