- SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.Average lead time: 42 days£57.30Average lead time: 42 days
- SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.Average lead time: 18 days£35.65Average lead time: 18 days
SEM Specimen Stubs, 15mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.Average lead time: 52 daysFrom £35.86
Average lead time: 52 days
