SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Average lead time: 43 days£14.14Average lead time: 43 days
Thin Specimen Split Mount Holder, M4 AG15335-4Simple but effective design to hold wafers and thin samples up to 3.2mm (1/8").Average lead time: 8 days£42.33Average lead time: 8 days
Specimen Mount, 15mm dia x 15mm (Pk10) AG16281Aluminium specimen Mount, 15mm dia x 15mm for ISI/ABT/TOPCON, also used for JEOL.Average lead time: 12 days£30.13Average lead time: 12 days
