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SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168
SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.
Average lead time: 41 days
£57.30
Average lead time: 41 days

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SALE
SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167
SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.
Average lead time: 17 days
£35.65
Average lead time: 17 days

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SEM Specimen Stubs, 15mm dia, 5mm high
SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.
Average lead time: 51 days
From £35.86
Average lead time: 51 days
SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425
SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.
Average lead time: 41 days
£14.14
Average lead time: 41 days

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Specimen Mount, 15mm dia x 15mm (Pk10) AG16281
Aluminium specimen Mount, 15mm dia x 15mm for ISI/ABT/TOPCON, also used for JEOL.
Average lead time: 10 days
£30.13
Average lead time: 10 days

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