The tip is located exactly at the end of the cantilever, which allows exact positioning of the tip apex over the region of interest on the sample surface.
Consistent cantilever and tip properties
State-of-the-art manufacturing process ensures consistency in cantilever and tip properties. High quality factor, smooth resonance curves, good cantilever reflectivity and excellent tip sharpness are some of the many advantages you can count on with every single OPUS silicon microcantilever.
Industry standard holder chips
OPUS microcantilever holder chips have industry standard dimensions (3.4 x 1.6 x 0.315mm) and fit all AFM systems that use unmounted probes. The individual cantilever models feature alignment grooves on the back surface of the chip.
High quality base silicon material
All OPUS silicon microcantilevers are manufactured from highly n-doped mono-crystalline silicon with resistivity in the range 0.01 - 0.025Ω-cm for static charge dissipation. The cantilever and chip surface is a (100) plane and the cantilevers point in the direction.
PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
Three AFM cantilevers, without coating, 17/150/75kHz, 0.3/9/2.5N/mThree AFM cantilevers without coating for various applications. Topography measurement.Average lead time: 20 days
Three AFM cantilevers, Al reflective coating, 17/150/75kHz,...Three AFM cantilevers with Al reflective for various applications. Topography measurement.Average lead time: 20 days
