High freqencey cantilever, Al reflective coating 1200kHz 100N/m
High frequency tapping mode cantilever with Al reflective coating. Topography measurement.
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Product DescriptionFeatures & SpecificationsDelivery & Returns
The 55AC-NA series is designed for high speed AC mode imaging. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminium coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the are of interest on the sample surface.
Tip Side coating: none
Back Side coating: Al, 30nm
Cantilever
Single
Resonant Frequency (kHz)
1200 (650 - 1850)
Force Constant (N/m)
100 (35 - 215)
Tip Radius (nm)
< 7
Length (±10µm)
65
Width (±2µm)
31
Thickness (±0.5µm)
3
Tip Side Coating
None
Back Side Coating
Al, 30nm