AFM cantilever, Pt coating 70kHz 2N/m
Soft tapping mode AFM cantilever with magnetic tip coating. Electrical measurements.
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The 240AC-PP is designed for AC mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc. The overall platinum coating ensures high electrical conductivity and significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
Tip Side coating: Pt, 25nm
Back Side coating: Pt, 25nm
Cantilever
Single
Resonant Frequency (kHz)
70 (45 - 90)
Force Constant (N/m)
2 (0.6 - 3.9)
Tip Radius (nm)
< 25
Length (±10µm)
240
Width (±2µm)
40
Thickness (±0.5µm)
2.6
Tip Side Coating
Pt, 25nm
Back Side Coating
Pt, 25nm