AFM cantilever, Al reflective coating 300kHz 26N/m
Standard tapping mode AFM cantilever with Al reflective coating. Topography measurement.
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Product DescriptionFeatures & SpecificationsDelivery & Returns
The 160AC NA series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminium coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
Tip Side coating: none
Back Side coating: Al, 30nm
Cantilever
Single
Resonant Frequency (kHz)
300 (200 - 400)
Force Constant (N/m)
26 (8 - 57)
Tip Radius (nm)
< 7
Length (±10µm)
160
Width (±2µm)
40
Thickness (±0.5µm)
4
Tip Side Coating
None
Back Side Coating
Al, 30nm