292nm pitch resolution reference standards for AFM
292nm pitch reference standard for very high resolution calibration of AFM.
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The 292nm pitch is accurate to ±1%. The surface structure is titanium lines on silicon. The line height is approximately 30nm with a line width of 130nm (not calibrated).
For AFM it can be used in contact, tapping, and other modes, with image sizes from 500nm to 20µm.
It can be supplied either non-certified, or with a non-traceable manufacturer’s certificate stating average pitch based on batch measurements.
LEAD TIMES: Average Lead Times are shown individually in days for any products not currently in stock. Whilst we are working closely with our suppliers to minimise the impact of global supply chain issues, and regularly update our product prices and lead times, some are subject to change due to supply chain fluctuations.
Delivery is calculated at the checkout, please see our delivery and returns page for more information.
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.